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Synthesis & Characterization of Nanodot Embedded MOS-C for the NVM

AUTHOR Mukhopadhyay Sabyasachi; Sarkar Mitra Barun
PUBLISHER LAP Lambert Academic Publishing (01/12/2015)
PRODUCT TYPE Paperback (Paperback)

Description
Achieving lower dimensional electronic device in today's world has been increased enormously. Miniaturization technique has been improved in connection to maintain noble device properties. Processes incorporated to nano range fabrication are always intricate, as various quantum size effects play important role in this regime. Understanding the physics of low-dimensional systems and the operation of next-generation electronics will be helpful in bringing revolutionary changes to mankind. Phenomena surrounding the nanoparticles have been discussed and the discussion has been divided into two broad categories: synthesis and characterization of the nanoparticles embedded MOS capacitor. Capacitance peaks in the inversion region due to carrier tunneling into the quantum dot and Coulomb blockade charging in quantum dot has been observed, which elucidated the charge storing phenomena of nanoparticles.
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Product Details
ISBN-13: 9783659670398
ISBN-10: 3659670391
Binding: Paperback or Softback (Trade Paperback (Us))
Content Language: English
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Page Count: 56
Carton Quantity: 126
Product Dimensions: 6.00 x 0.13 x 9.00 inches
Weight: 0.21 pound(s)
Country of Origin: US
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BISAC Categories
Technology & Engineering | Electronics - General
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Achieving lower dimensional electronic device in today's world has been increased enormously. Miniaturization technique has been improved in connection to maintain noble device properties. Processes incorporated to nano range fabrication are always intricate, as various quantum size effects play important role in this regime. Understanding the physics of low-dimensional systems and the operation of next-generation electronics will be helpful in bringing revolutionary changes to mankind. Phenomena surrounding the nanoparticles have been discussed and the discussion has been divided into two broad categories: synthesis and characterization of the nanoparticles embedded MOS capacitor. Capacitance peaks in the inversion region due to carrier tunneling into the quantum dot and Coulomb blockade charging in quantum dot has been observed, which elucidated the charge storing phenomena of nanoparticles.
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