Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,
| AUTHOR | Murr, Lawrence E.; Murr, Lawrence E. |
| PUBLISHER | CRC Press (07/25/1991) |
| PRODUCT TYPE | Hardcover (Hardcover) |
Description
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Product Format
Product Details
ISBN-13:
9780824785567
ISBN-10:
0824785568
Binding:
Hardback or Cased Book (Sewn)
Content Language:
English
Edition Number:
0002
More Product Details
Page Count:
856
Carton Quantity:
8
Product Dimensions:
7.26 x 1.76 x 10.24 inches
Weight:
3.46 pound(s)
Feature Codes:
Bibliography,
Index,
Illustrated
Country of Origin:
US
Subject Information
BISAC Categories
Technology & Engineering | Engineering (General)
Technology & Engineering | Electron Microscopes & Microscopy
Technology & Engineering | Lasers & Photonics
Dewey Decimal:
502.825
Library of Congress Control Number:
91020173
List Price $425.00
Your Price
$420.75